Scanning XPS Microprobe

X-ray Photoelectron Spectroscopy (XPS) is the most widely used
surface analysis technique because it can be applied to a broad
range of materials and provides valuable quantitive elemental
and chemical state information from the surface of the material
being studied.
The information XPS provides about surface layers, thin film
structures and interfaces is important for many industrial and
research applications where composition plays a critical role in
performance. It is widely used for polymers, metals, ceramics,
catalysts, thin films, photovoltaics, batteries, wear coatings,
nanomaterials, semiconductor devices, magnetic storage media,
display technology, 2-D materials and biomedical devices.
Physical Electronics (PHI) XPS instruments provide the ability to
obtain spectra with a lateral spatial resolution as small as 10 µm
for the Al K X-ray source.